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May 30, 2000
The Nikon Corporation (President : YOSHIDA, Shoichiro) has developed the FX-21S Large-Plate Exposure System and will start shipping for the new system on July 1, 2000.
The FX-21S forms an image of a mask pattern using a new multiple-lens projection optical system and exposes the pattern on a glass plate in a repeating step-and-scan process. The FX-21S system achieves efficient mass production of panels for 15- to 20-inch PC and TV liquid crystal monitors. These large monitors are fast becoming standard products, and the new FX-21S will enhance productivity in this crucial area.
Development Background
Thin film transistor (TFT) active matrix LCD technology was the key to the success of the notebook computer display market and now applications are found in desktop monitors. Since 15-inch panels are also being adopted for TV monitors and development is underway to use LCD panels in large wall-mounted TVs, the LCD market is expected to become even larger.
The new Nikon FX-21S Large-Plate Exposure System can easily produce LCD panels up to 30 inches wide. Compared to previous systems, the FX-21S realizes a dramatic improvement in throughput for the production of 15- to 20-inch panels, with a 1.7-fold increase in throughput for 15-inch panels, a 2.7-fold increase for 18-inch panels, and a 2.2-fold increase for 21-inch panels.
The FX-21S is optimally suited for the mass production of such large-monitor panels and will therefore contribute to improved productivity for TFT active matrix LCDs.
Main Features
Main Specifications
| Resolution | 2.4 micrometer or less (Isolated patterns), 3 micrometer or less (L / S) |
|---|---|
| Exposure Field | 400 x 700 mm |
| Projection Magnification | 1:1 |
| Alignment Accuracy | 0.6 micrometer or less (3 sigma) |
| Maximum Plate Size | 800 x 950 mm2 |
| Mask Size | 500 x 750 mm |
The export of this product is controlled by Japanese Foreign Exchange Trade Law and International export control regime. They shall not be exported without authorization from the appropriate governmental authorities. May 2000