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IC Inspection MicroscopeECLIPSE L200 for DIC Observation

Incorporating the CFI60 optical system boasting optical performance at the world’s highest level, it minimizes flare to achieve high contrast.
• New objectives with a 60mm parfocal distance provide both high NA's and long working distances
• Complete anti-contamination design

For DIC observation
• Nomarski prism in the nosepiece supports all objectives—Single DIC system—to produce DIC images with minimum deviation in color density

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