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 These “Universal” models combine a measuring stand with the best of Nikon’s metallurgicalmicroscope components for high resolution imaging and critical measurements. Featuring thefull range of Nikon advanced LU objectives and microscopy techniques including: brightfield,darkfield, DIC contrast, polarizing and epi-fluorescence. Up to five objectives may bemounted on the nosepiece. Moreover, important controls in the microscope—e.g. Z-axismovement, focusing and illumination switchover—have been automated or motorized tostreamline imaging operations such as digital image capture, digital field-of-viewmeasurement and data storage. |
| Applications: Semiconductor packages, Bonding placement, Loop height, FPD panel (LCM) MEMS, Wafer level CSP, HDD slider |
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