| N-SIS III, the light source system for CCD test designed to be used in wafer level inspection and final inspection as well. |
CCDs are getting heavy demand as the eyes of camcorders and digital cameras.
N-SISIII generates programmed light which meets any kind of functional tests in wafer level or in final stage.
Thanks to the high intensity of light and quick movement of mechanism, N-SISIII does improve throughput and increase your yield.
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