L100

L100 is perfect for applications in which measurements need to be taken quickly over a wide range without compromising precision. This scanner offers the best possible combination of speed, accuracy, and ease-of-use. Suited for both surface and feature measurement, L100 quickly delivers accurate data and insightful part-to-CAD comparison reports even on shiny or multi-material surfaces.

Features

Applications

  L100
Probing error, MPEp(1σ)* 6.5 μm
Width of view 110 mm (Max.)
Depth of view 60 mm
Stand-off 105 mm
Data acquisition speed 200,000 points/sec
ESP generation ESP4

Related solutions

BENEFITS OF CMM-BASED LASER SCANNING

  • Simplified measurement and processing setup
    • Teach scan paths or indicate scan area on CAD
    • Import feature properties and GD&T information directly from CAD
    • Macro functionality for fully automated scanning and inspection
  • Reduced measurement time
    • Reduction of probe head movements
    • XC65Dx(-LS) scanner captures full feature information in a single movement
  • Unique capability to measure freeform and fragile surfaces
    • Detailed description of freeform surface in short time interval
    • Non-contact measurement eliminates the need to touch fragile and delicate parts
    • Powerful reporting with colored CAD deviation maps
    • Input for reverse engineering, rapid prototyping, finite element calculations, and digital archiving