MCT225 for Metrology CT

MCT225 offering absolute accuracy for inside geometry

MCT225 efficiently measures internal and external geometry without reference measurements and damaging the sample. With fifty years’ CMM experience and twenty five years’ X-ray experience, our pedigree for reliable high quality Metrology CT is second to none.

Features

Applications

Metology CT process

Benefits

  • Flexibility combined in a single system: X-ray for quick visual inspection, CT for in-depth analysis
  • Fast data capture and high-quality images
  • Fast operation with interactive joystick navigation
  • High-resolution digital imaging and processing
  • Safe system requiring no special precautions or badges
  • Tight integration with industry standard post-processing applications

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