XT V 130 Electronics X-ray Inspection

Compact, versatile and easy-to-use electronics QA system

The XT V 130C is a highly flexible and costeffective electronics and semiconductor inspection system. The system features a 130 kV/10 watt Nikon Metrology manufactured source, a globally recognized open tube design with integrated generator, and a high-resolution imaging chain.

Superb image magnification enables users to zoom in on any specific item of interest

Features

Applications

Benefits

Related solutions

Tilt angles up to 75° offers sufficient flexibility to trace connectivity issues quickly